Emission stability of DLC coated metal-tips FEA

Proceedings of the IEEE International Vacuum Microelectronics Conference, IVMC

Volumn , Issue , 1996, Pages 231-234

  Jung, Jae Hoon ^a   Ju, Byeong Kwon ^a   Lee, Yun Hi ^a   Park, Kyu Chang ^a   Jang, Jin ^a   Jung, Yu Ho ^a   Kim, Chul Ju ^a   Oh, Myung Hwan ^a  

^a Korea Institute of Science and Technology   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; DIAMOND FILMS; ELECTRIC CURRENT MEASUREMENT; ELECTRON EMISSION; MOLYBDENUM; PROTECTIVE COATINGS;

MOLYBDENUM FIELD EMITTER ARRAYS (FEA); NEGATIVE ELECTRON AFFINITY (NEA);

FIELD EMISSION CATHODES;

EID: 0030354220     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)