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Fresenius' Journal of Analytical Chemistry

Volumn 355, Issue 5-6, 1996, Pages 596-600

Raman spectroscopy of advanced materials

(1) Huong, Pham V a

a UNIVERSITÉ DE BORDEAUX (France)

Author keywords

[No Author keywords available]

Indexed keywords

FULLERENES; LAMINATES; MICROANALYSIS; MICROSTRUCTURE; MOLECULAR STRUCTURE; SEMICONDUCTOR MATERIALS; STOICHIOMETRY; SUPERCONDUCTING MATERIALS; SURFACE STRUCTURE;

ADVANCED MATERIALS; ANALYSIS METHOD; SOLID-SOLID INTERFACES;

RAMAN SPECTROSCOPY;

EID: 0030353049 PISSN: 09370633 EISSN: None Source Type: Journal
DOI: 10.1007/s0021663550596 Document Type: Article

Times cited : (6)

References (39)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.