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Volumn 2814, Issue , 1996, Pages 36-45
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Simultaneous interferometric optical figure characterizations for nominal optical flat and Dewar-window system at cryogenic temperatures
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Author keywords
[No Author keywords available]
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Indexed keywords
CRYOGENIC OPTICAL FIGURE MEASUREMENTS;
DEWAR WINDOW SYSTEMS;
INTERFEROMETRIC OPTICAL FIGURE CHARACTERIZATION;
WAVEFRONT DISTORTION;
CALIBRATION;
CHARACTERIZATION;
CRYOGENICS;
DATA REDUCTION;
INTERFEROMETRY;
OPTICAL VARIABLES MEASUREMENT;
OPTICAL SYSTEMS;
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EID: 0030349925
PISSN: 0277786X
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Article |
Times cited : (2)
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References (1)
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