Simultaneous mean and texture edge detection in SAR clutter

IEE Proceedings: Radar, Sonar and Navigation

Volumn 143, Issue 6, 1996, Pages 391-399

  Oliver, C J ^a,b   Lombardo, P ^a,c  

^a DEFENCE SCIENCE AND TECHNOLOGY LABORATORY   (United Kingdom)

^b KING'S COLLEGE LONDON   (United Kingdom)

^c UNIVERSITY OF BIRMINGHAM   (United Kingdom)

Author keywords

Maximum likelihood tests; SAR clutter; Simultaneous mean

Indexed keywords

EDGE DETECTION; IMAGE SEGMENTATION; OPTIMIZATION; PARAMETER ESTIMATION; PROBABILITY; RADAR CROSS SECTION; RADAR IMAGING; SPECKLE; STATISTICS; SYNTHETIC APERTURE RADAR;

K DISTRIBUTED STATISTICS; MAXIMUM LIKELIHOOD TESTS; SIMULTANEOUS MEAN; SYNTHETIC APERTURE RADAR CLUTTER; TEXTURE EDGE DETECTION;

RADAR CLUTTER;

EID: 0030349036     PISSN: 13502395     EISSN: None     Source Type: Journal    
DOI: 10.1049/ip-rsn:19960728     Document Type: Article

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