High resolution multihit time to digital converter integrated circuit

IEEE Nuclear Science Symposium & Medical Imaging Conference

Volumn 1, Issue , 1996, Pages 421-425

  Gorbics, M S ^a   Kelly, J ^a   Roberts, K M ^a   Sumner, R L ^a  

^a LeCroy Corporation   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; SEMICONDUCTOR DEVICE TESTING;

TIME TO DIGITAL CONVERTERS; VERNIER PRINCIPLE;

ANALOG TO DIGITAL CONVERSION;

EID: 0030348540     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (1)