Automated visual inspection of magnetic disk media

Proceedings of the IEEE International Conference on Electronics, Circuits, and Systems

Volumn 2, Issue , 1996, Pages 732-735

  Hepplewhite, L ^a   Stonham, T J ^a   Glover, R J ^a  

^a BRUNEL UNIVERSITY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

DEFECTS; PATTERN RECOGNITION; QUALITY CONTROL; RELIABILITY;

AUTOMATED VISUAL INSPECTION; BRODATZ TEXTURE ALBUM;

MAGNETIC DISK STORAGE;

EID: 0030348521     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (11)