Current conveyor based BIC sensor for current monitoring in mixed-signal circuits

Proceedings of the IEEE International Conference on Electronics, Circuits, and Systems

Volumn 2, Issue , 1996, Pages 1210-1212

  Siskos, S ^a   Laopoulos, Th ^a   Hatzopoulos, A A ^a   Bafleur, M ^a  

^a ARISTOTLE UNIVERSITY OF THESSALONIKI   (Greece)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CURRENT MEASUREMENT; ELECTRIC FAULT LOCATION; INTEGRATED CIRCUIT TESTING; MIXER CIRCUITS;

BUILT IN CURRENT SENSORS (BICS); MIXED SIGNAL TESTING; QUIESCENT CURRENT MONITORING; SECOND GENERATION CURRENT CONVEYOR;

AMPEROMETRIC SENSORS;

EID: 0030348508     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)