High energy X-ray computed tomography using silicon semiconductor detectors

IEEE Nuclear Science Symposium & Medical Imaging Conference

Volumn 2, Issue , 1996, Pages 816-820

  Miyai, H ^a   Satou, K ^a   Kitaguchi, H ^a   Izumi, S ^a  

^a HITACHI LTD   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROMAGNETIC WAVE SCATTERING; ELECTRON SCATTERING; OPTICAL COLLIMATORS; SILICON SENSORS; THIN FILM DEVICES; X RAY RADIOGRAPHY;

HIGH ENERGY X RAY COMPUTED TOMOGRAPHY;

COMPUTERIZED TOMOGRAPHY;

EID: 0030348378     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (4)