An Image Analysis Problem in Electron Microscopy

Journal of the American Statistical Association

Volumn 91, Issue 435, 1996, Pages 944-952

  Qian, W ^a   Titterington, D M ^a   Chapman, J N ^a  

^a UNIVERSITY OF GLASGOW   (United Kingdom)

Author keywords

Electron microscopy; Image restoration; Iterative Conditional Modes; Markov random fields

Indexed keywords

EID: 0030328844     PISSN: 01621459     EISSN: 1537274X     Source Type: Journal    
DOI: 10.1080/01621459.1996.10476964     Document Type: Article

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