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Volumn , Issue , 1996, Pages 368-373
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Measurement of contaminant adsorption by quartz crystal microbalance techniques
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Author keywords
[No Author keywords available]
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Indexed keywords
ADSORPTION;
CHEMICAL SENSORS;
CONTAMINATION;
PH;
SOLUTIONS;
SURFACE ACTIVE AGENTS;
QUARTZ CRYSTAL MICROBALANCE (QCM);
SEMICONDUCTOR DEVICE MANUFACTURE;
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EID: 0030315611
PISSN: 00739227
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (2)
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References (34)
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