|
Volumn 12, Issue 2-4, 1996, Pages 167-175
|
Raman, X-ray and electrical properties of MOD PZT/PLZT thin films
a a a |
Author keywords
AFM; Dielectric properties; MOD process; PZT film; Raman scattering; Structural transformation
|
Indexed keywords
ATOMIC FORCE MICROSCOPY;
FERROELECTRICITY;
FILM GROWTH;
LEAD COMPOUNDS;
MATHEMATICAL MODELS;
ORGANOMETALLICS;
PHASE TRANSITIONS;
RAMAN SCATTERING;
THIN FILMS;
X RAY DIFFRACTION ANALYSIS;
LEAD ZIRCONATE TITANATE;
ROSETTE GROWTH MODEL;
DIELECTRIC FILMS;
|
EID: 0030313851
PISSN: 10584587
EISSN: None
Source Type: Journal
DOI: 10.1080/10584589608013060 Document Type: Article |
Times cited : (11)
|
References (18)
|