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Volumn 12, Issue 2-4, 1996, Pages 167-175

Raman, X-ray and electrical properties of MOD PZT/PLZT thin films

Author keywords

AFM; Dielectric properties; MOD process; PZT film; Raman scattering; Structural transformation

Indexed keywords

ATOMIC FORCE MICROSCOPY; FERROELECTRICITY; FILM GROWTH; LEAD COMPOUNDS; MATHEMATICAL MODELS; ORGANOMETALLICS; PHASE TRANSITIONS; RAMAN SCATTERING; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

EID: 0030313851     PISSN: 10584587     EISSN: None     Source Type: Journal    
DOI: 10.1080/10584589608013060     Document Type: Article
Times cited : (11)

References (18)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.