Electrical characterization of SrBi2Ta2O9 thin films for ferroelectric non-volatile memory applications

Integrated Ferroelectrics

Volumn 12, Issue 1, 1996, Pages 23-31

  Jones Jr , R E ^a   Zurcher, Peter ^a   Jiang, B ^a   Witowski, J Z ^a   Lii, Y T ^a   Chu, P ^a   Taylor, D J ^a   Gillespie, S J ^a  

^a MOTOROLA INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BISMUTH COMPOUNDS; CHEMICAL VAPOR DEPOSITION; ELECTRIC PROPERTIES; FERROELECTRIC DEVICES; OXIDES; POLARIZATION; TANTALUM COMPOUNDS; THIN FILMS;

FERROELECRIC CAPACITORS; NON-VOLATILE POLARIZATION;

FERROELECTRIC MATERIALS;

EID: 0030312195     PISSN: 10584587     EISSN: None     Source Type: Journal    
DOI: 10.1080/10584589608225745     Document Type: Article

References (23)

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