New technique to monitor the electrode and lead failures in implantable microstimulators and sensors

Annual International Conference of the IEEE Engineering in Medicine and Biology - Proceedings

Volumn , Issue 1, 1996, Pages 181-182

  Arabi, Karim ^a   Kaminska, Bozena ^a  

^a ÉCOLE POLYTECHNIQUE DE MONTRÉAL   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

BIOSENSORS; CMOS INTEGRATED CIRCUITS; ELECTRIC RESISTANCE; INTEGRATED CIRCUIT TESTING; MICROELECTRODES; OSCILLATORS (ELECTRONIC); TISSUE;

MICROSTIMULATORS;

ELECTRONIC MEDICAL EQUIPMENT;

EID: 0030311848     PISSN: 05891019     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (6)