Total emissivity measurements without use of an absolute reference

Infrared Physics and Technology

Volumn 37, Issue 7, 1996, Pages 777-784

  Especel, D ^a   Mattei S ^a  

^a UNIVERSITÉ PARIS EST CRÉTEIL   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EMISSION SPECTROSCOPY; INFRARED RADIATION; LIGHT REFLECTION; MEASUREMENT ERRORS; MODULATION; THERMAL EFFECTS;

EMISSIVITY MEASUREMENT;

RADIOMETRY;

EID: 0030311693     PISSN: 13504495     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1350-4495(96)00017-5     Document Type: Article

References (9)

1. P. Masclet, Thèse de Doctorat d'état, Université Paris VI (1993).
2. J.F. Sacadura, Proc. 9th Int. Heat Transf. Conf, Jerusalem I (1990) 207-222.
3. Hladik, J. Métrologie des Propriétés Thermo-Physiques des Matériaux, Collection Mesures Physiques, ISBN 2 225 82199 2 (Masson, 1990).
4. A. Ono, Proc. 8th Symp. Thermophys. Prop., ed. J.V. Sengers, Vol. 2 (ASME, New York, 1982) pp. 133-137.
5. T. Loarer and J.J. Greffet, Appl. Opt. 29(7) (1990) 979-987.
6. J.F. Schatz and G. Simmons, J. Appl. Phys. 23(6) (1972) 2586-2594.
7. W.P. Leung and A.C. Tarn, J. Appl. Phys. 56(1) (1984) 153-161.
8. D. Especel and S. Matteï, Proc. 1st Eur. Conf. on Thermal Sci. Birmingham 1 (1992) 709-715.
9. S. Matteï, D. Especel and Y. N'Guessan, Rev. Gen. Therm. 388 (1994) 258-264.