Plasma source ion trap mass spectrometry: Enhanced abundance sensitivity by resonant ejection of atomic ions

Journal of the American Society for Mass Spectrometry

Volumn 7, Issue 11, 1996, Pages 1161-1171

  Eiden, G C ^a   Barinaga, C J ^a   Koppenaal, D W ^a  

^a PACIFIC NORTHWEST NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ION;

ABSORPTION; ARTICLE; MASS SPECTROMETRY; PLASMA;

EID: 0030298131     PISSN: 10440305     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1044-0305(96)00075-X     Document Type: Article

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