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Volumn 524, Issue 1-2, 1996, Pages 237-245

Synthese und kristallstrukturen von cyclosilazanen mit ungewöhnlichen konformationen

Author keywords

Crystal structures; Cyclosilazanes; Silicon

Indexed keywords


EID: 0030295773     PISSN: 0022328X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-328X(96)06393-0     Document Type: Article
Times cited : (8)

References (23)
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    • (1966) Angew. Chem. , vol.78 , pp. 803
    • Fink, W.1
  • 3
    • 84981789406 scopus 로고
    • [2] W. Fink, Angew. Chem., 78 (1966) 803; Angew. Chem. Int. Ed. Engl., 5 (1966) 760.
    • (1966) Angew. Chem. Int. Ed. Engl. , vol.5 , pp. 760
  • 9
    • 0011627334 scopus 로고
    • [8] U. Klingebiel und N. Vater, Angew. Chem., 94 (1982) 870; Angew. Chem. Int. Ed. Engl., 21 (1982) 857; Chem. Ber., 116 (1983) 3277.
    • (1982) Angew. Chem. , vol.94 , pp. 870
    • Klingebiel, U.1    Vater, N.2
  • 10
    • 84985612763 scopus 로고
    • [8] U. Klingebiel und N. Vater, Angew. Chem., 94 (1982) 870; Angew. Chem. Int. Ed. Engl., 21 (1982) 857; Chem. Ber., 116 (1983) 3277.
    • (1982) Angew. Chem. Int. Ed. Engl. , vol.21 , pp. 857
  • 11
    • 0040173607 scopus 로고
    • [8] U. Klingebiel und N. Vater, Angew. Chem., 94 (1982) 870; Angew. Chem. Int. Ed. Engl., 21 (1982) 857; Chem. Ber., 116 (1983) 3277.
    • (1983) Chem. Ber. , vol.116 , pp. 3277
  • 21
    • 0004150157 scopus 로고
    • Siemens Analytical X-Ray Instruments, Inc., Madison, WI, USA
    • [18] SHELXTL PLUS, Version 4.21/V, 1990 (Siemens Analytical X-Ray Instruments, Inc., Madison, WI, USA).
    • (1990) SHELXTL PLUS, Version 4.21/V


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.