Density saturation of densely contact-electrified negative charges on a thin silicon oxide sample due to the coulomb repulsive force

Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties

Volumn 74, Issue 5, 1996, Pages 1339-1346

  Sugawara, Y ^a   Tsuyuguchi, T ^a   Uchihashi, T ^a   Okusako, T ^a   Fukano, Y ^a,c   Yamanishi, Y ^b   Oasa, T ^b   Morita, S ^a  

^a HIROSHIMA UNIVERSITY   (Japan)

^b Sumitomo Metal Industries Limited   (Japan)

^c HITACHI LTD   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0030293506     PISSN: 01418610     EISSN: None     Source Type: Journal    
DOI: 10.1080/01418619608239733     Document Type: Article

References (6)

1. Furano, Y., Sugawara, Y., Uchihashi, T., Okusako, T., Morita, S., Yamanishi, Y., and Oasa, T., 1996, Jap. J. appi. Phys., 35, 2394.
2. Morita, S., Furano, Y., Uchihashi, T., Orusaro, T., Sugawara, Y., Yamanishi, Y., and Oasa, T., 1993a, Jap. J. appi. Phys., 32, L1701.
3. Morita, S., Sugawara, Y., Furano, Y., Uchihashi, T., Orusaro, T., Chayahara, A., Yamanishi, Y., and Oasa, T., 1993b, Jap. J. appi. Phys., 32, L1852.
4. Saurenbach, F., and Terris, B. D., 1992, IEEE Trans, ind. Applic., 28, L256.
5. Sugawara, Y., Morita, S., Furano, Y., Uchihashi, T., Orusaro, T., Chayahara, A., Yamanishi, Y., and Oasa, T., 1994, Jap. J. appi. Phys., 33, L70.
6. Tsuyuguchi, T., Uchihashi, T., Orusaro, T., Sugawara, Y., Morita, S., Yamanishi, Y., and Oasa, T., 1994, Jap. J. appi. Phys., 33, L1046.