|
Volumn 382, Issue 3, 1996, Pages 533-544
|
Beam test performance of the APV5 chip
d
CERN
(Switzerland)
|
Author keywords
[No Author keywords available]
|
Indexed keywords
INTEGRATED CIRCUIT LAYOUT;
MICROPROCESSOR CHIPS;
MICROSTRIP DEVICES;
PARTICLE BEAM DYNAMICS;
PIPELINE PROCESSING SYSTEMS;
RADIATION HARDENING;
SILICON SENSORS;
RADIATION HARD FRONT END CHIP;
SILICON MICROSTRIP DETECTOR;
PARTICLE BEAM TRACKING;
|
EID: 0030291782
PISSN: 01689002
EISSN: None
Source Type: Journal
DOI: 10.1016/S0168-9002(96)00816-9 Document Type: Article |
Times cited : (3)
|
References (8)
|