TEM study of electrodeposited Ni/Cu multilayers in the form of nanowires

Thin Solid Films

Volumn 288, Issue 1-2, 1996, Pages 86-89

  Wang, L ^a   Yu Zhang, K ^b   Metrot, A ^a   Bonhomme, P ^a   Troyon, M ^a  

^a UNIVERSITÉ DE REIMS CHAMPAGNE ARDENNE   (France)

^b UNIVERSITÉ GUSTAVE EIFFEL   (France)

Author keywords

Electrochemistry; Multilayers; Nanostructures; Transmission electron microscopy

Indexed keywords

COPPER; ELECTROCHEMISTRY; ELECTRODEPOSITION; FILM GROWTH; NANOSTRUCTURED MATERIALS; NICKEL; POLYCARBONATES; POLYMERIC MEMBRANES; TRANSMISSION ELECTRON MICROSCOPY;

ELECTRODEPOSITED NICKEL/COPPER MULTILAYERS; NANOPORES; NANOWIRES; POLYCARBONATE MEMBRANES;

METALLIC SUPERLATTICES;

EID: 0030291199     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(96)08791-3     Document Type: Article

References (10)

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