메뉴 건너뛰기




Volumn 47, Issue 11, 1996, Pages 1371-1378

Effect of Ga incorporation in polycrystalline CuInSe2 films

Author keywords

[No Author keywords available]

Indexed keywords

COMPOSITION EFFECTS; CRYSTAL MICROSTRUCTURE; DEPOSITION; ELECTRIC FIELD MEASUREMENT; GRAIN BOUNDARIES; GRAIN SIZE AND SHAPE; OPTICAL VARIABLES MEASUREMENT; POLYCRYSTALLINE MATERIALS; SEMICONDUCTING GALLIUM COMPOUNDS; SEMICONDUCTING INDIUM COMPOUNDS; STRESS ANALYSIS; SURFACE ROUGHNESS;

EID: 0030290659     PISSN: 0042207X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0042-207X(96)00194-7     Document Type: Article
Times cited : (8)

References (35)
  • 13
    • 0009748145 scopus 로고
    • 11-15 April Amsterdam, The Netherlands
    • Schock, H. W., Proc. 12th European PVSEC, 11-15 April 1994, Amsterdam, The Netherlands, p. 944.
    • (1994) Proc. 12th European PVSEC , pp. 944
    • Schock, H.W.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.