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Volumn 17, Issue 11, 1996, Pages 503-505

Low-temperature and low thermal budget fabrication of polycrystalline silicon thin-film transistors

Author keywords

[No Author keywords available]

Indexed keywords

AMMONIA; CHEMICAL POLISHING; CHEMICAL VAPOR DEPOSITION; CRYSTALLIZATION; ELECTRIC CURRENTS; GLASS; PLASMAS; POLYCRYSTALLINE MATERIALS; SEMICONDUCTING SILICON; SEMICONDUCTOR GROWTH; SILICON WAFERS; SUBSTRATES;

EID: 0030290018     PISSN: 07413106     EISSN: None     Source Type: Journal    
DOI: 10.1109/55.541762     Document Type: Article
Times cited : (7)

References (11)
  • 1
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    • H. Ohshima and S. Morozumi, "Future trends for TFT integrated circuits on glass substrates," in IEDM Tech. Dig., 1989, vol. 89, p. 157.
    • (1989) IEDM Tech. Dig. , vol.89 , pp. 157
    • Ohshima, H.1    Morozumi, S.2
  • 2
    • 0029246215 scopus 로고
    • High performance poly-Si TFT's fabricated using pulsed laser annealing and remote plasma CVD with low temperature processing
    • A. Kohno, T. Sameshima, N. Sano, M. Sekiya, and M. Hara, "High performance poly-Si TFT's fabricated using pulsed laser annealing and remote plasma CVD with low temperature processing," IEEE Trans. Electron Devices, vol. 42, pp. 251-257, 1995.
    • (1995) IEEE Trans. Electron Devices , vol.42 , pp. 251-257
    • Kohno, A.1    Sameshima, T.2    Sano, N.3    Sekiya, M.4    Hara, M.5
  • 3
    • 0000765207 scopus 로고
    • Deposition and device appliation of in situ boron-doped polycrystalline SiGe films grown at low temperature
    • H. C. Lin, H. Y. Lin, C. Y. Chang, T. F. Lei, P. J. Wang, R. C. Deng, J. Lin, and C. Y. Chao, "Deposition and device appliation of in situ boron-doped polycrystalline SiGe films grown at low temperature," J. Appl. Phys., vol. 74, p. 5395, 1993.
    • (1993) J. Appl. Phys. , vol.74 , pp. 5395
    • Lin, H.C.1    Lin, H.Y.2    Chang, C.Y.3    Lei, T.F.4    Wang, P.J.5    Deng, R.C.6    Lin, J.7    Chao, C.Y.8
  • 5
    • 0000403217 scopus 로고
    • Low temperature poly-Si TFT's using solid phase crystallization of very thin films and an electron cyclotron resonance chemical vapor deposition gate insulator
    • T. W. Little, K. Takahara, H. Koike, T. Nakazawa, I. Yudasaka, and H. Ohshima, "Low temperature poly-Si TFT's using solid phase crystallization of very thin films and an electron cyclotron resonance chemical vapor deposition gate insulator," Jpn. J. Appl. Phys., vol. 30, no. 12B, pp. 3724-3728, 1991.
    • (1991) Jpn. J. Appl. Phys. , vol.30 , Issue.12 B , pp. 3724-3728
    • Little, T.W.1    Takahara, K.2    Koike, H.3    Nakazawa, T.4    Yudasaka, I.5    Ohshima, H.6
  • 7
    • 0026971543 scopus 로고
    • Characteristics of plasma-enhanced-chemical-vapor-deposition tetraethylorthosilicate oxide and thin-film transistor application
    • Y. Nishi, T. Funai, H. Izawa, T. Fujimoto, H. Morimoto, and M. Ishii, "Characteristics of plasma-enhanced-chemical-vapor-deposition tetraethylorthosilicate oxide and thin-film transistor application," Jpn. J. Appl. Phys., vol. 31, no. 12B, p. 4570, 1992.
    • (1992) Jpn. J. Appl. Phys. , vol.31 , Issue.12 B , pp. 4570
    • Nishi, Y.1    Funai, T.2    Izawa, H.3    Fujimoto, T.4    Morimoto, H.5    Ishii, M.6
  • 8
    • 0029379244 scopus 로고
    • Low temperature (≤600 °C) polysilicon thin-film transistors having in-situ doped polysilicon source and drain contacts
    • L. Pichon, F. Raoult, O. Bonnaud, J. Pinel, and M. Sarret, "Low temperature (≤600 °C) polysilicon thin-film transistors having in-situ doped polysilicon source and drain contacts," IEEE Electron Device Lett., vol. 16, no. 9, pp. 376-378, 1995.
    • (1995) IEEE Electron Device Lett. , vol.16 , Issue.9 , pp. 376-378
    • Pichon, L.1    Raoult, F.2    Bonnaud, O.3    Pinel, J.4    Sarret, M.5
  • 9
    • 0029392946 scopus 로고
    • Hydrogenation of polycrystalline silicon thin-film transistors by plasma ion implantation
    • J. D. Bernstein, S. Qin, C. Chan, and T. J. King, "Hydrogenation of polycrystalline silicon thin-film transistors by plasma ion implantation," IEEE Electron Device Lett., vol. 16, no. 10, pp. 421-423, 1995.
    • (1995) IEEE Electron Device Lett. , vol.16 , Issue.10 , pp. 421-423
    • Bernstein, J.D.1    Qin, S.2    Chan, C.3    King, T.J.4
  • 10
    • 0030109917 scopus 로고    scopus 로고
    • Fabrication of thin-film transistors by chemical mechanical polished polycrystalline silicon films
    • C. Y. Chang, H. Y. Lin, T. F. Lei, J. Y. Cheng, L. P. Chen, and B. T. Dai, "Fabrication of thin-film transistors by chemical mechanical polished polycrystalline silicon films," IEEE Electron Device Lett., vol. 17, no. 3, pp. 100-102, 1996.
    • (1996) IEEE Electron Device Lett. , vol.17 , Issue.3 , pp. 100-102
    • Chang, C.Y.1    Lin, H.Y.2    Lei, T.F.3    Cheng, J.Y.4    Chen, L.P.5    Dai, B.T.6


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.