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Volumn 80, Issue 9, 1996, Pages 5454-5458

Analysis of the dark current in the bulk of InAs diode detectors

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; DIFFUSION; ELECTRIC VARIABLES MEASUREMENT; ELECTRON TUNNELING; PASSIVATION; SEMICONDUCTING INDIUM COMPOUNDS; SEMICONDUCTOR DIODES; TEMPERATURE MEASUREMENT;

EID: 0030289935     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.362734     Document Type: Article
Times cited : (14)

References (22)
  • 8
    • 5544288797 scopus 로고
    • edited by W. T. Tseng Academic, California
    • Y. Horickoshi, Semiconductors and Semimetals, edited by W. T. Tseng (Academic, California, 1985), Vol. 22, part C.
    • (1985) Semiconductors and Semimetals , vol.22 , Issue.PART C
    • Horickoshi, Y.1
  • 9
    • 5544253091 scopus 로고
    • S. Maniv, SPIE 819, 103 (1987).
    • (1987) SPIE , vol.819 , pp. 103
    • Maniv, S.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.