Characterization of GaSb anodic oxide grown in a solution of 3% tartaric acid and ethylene glycol using XPS and ellipsometry

Materials Letters

Volumn 29, Issue 1-3, 1996, Pages 77-79

  Kitamura, Noboru ^a  

^a SUZUKA NATIONAL COLLEGE OF TECHNOLOGY   (Japan)

Author keywords

Anodic oxide; Ellipsometry; Ethylene glycol; GaSb; Tartaric acid; XPS

Indexed keywords

ARSENIC COMPOUNDS; GALLIUM COMPOUNDS; INTERFACES (MATERIALS); ORGANIC COMPOUNDS; OXIDES; SEMICONDUCTING FILMS; SEMICONDUCTOR DIODES; SOLUTIONS;

ANODE FILMS;

ANODIC OXIDATION;

EID: 0030289534     PISSN: 0167577X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0167-577X(96)00128-0     Document Type: Article

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