Etching of melt-processed YBa2Cu3O7-δ for SEM image analysis

Journal of Materials Science Letters

Volumn 15, Issue 21, 1996, Pages 1833-1835

  Chow, J C L ^a   Lo, Wai ^a   Leung, H T ^a   Cardwell, D A ^a  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); ETCHING; GROWTH (MATERIALS); IMAGE ANALYSIS; MOLTEN MATERIALS; PARTICLE SIZE ANALYSIS; PHASE DIAGRAMS; SCANNING ELECTRON MICROSCOPY; SOLIDIFICATION; STATISTICAL METHODS; SURFACE TREATMENT; TEXTURES;

PARTICLE INCLUSIONS; PHASE MATRIX; SEEDED PERITECTIC SOLIDIFICATION; SURFACE TOPOGRAPHY; YTTRIUM BARIUM CUPRATES;

HIGH TEMPERATURE SUPERCONDUCTORS;

EID: 0030289202     PISSN: 02618028     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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