Polarization effects in coherent optical frequency-domain reflectometry

IEEE Photonics Technology Letters

Volumn 8, Issue 11, 1996, Pages 1513-1515

  Mussi, G ^a   Stamp, P ^a   Gisin, N ^a   Passy, R ^b   Von Der Weid, J P ^b  

^a UNIVERSITY OF GENEVA   (Switzerland)

^b PONTIFICAL CATHOLIC UNIVERSITY OF RIO DE JANEIRO   (Brazil)

Author keywords

[No Author keywords available]

Indexed keywords

COHERENT LIGHT; DATA ACQUISITION; DISTRIBUTED FEEDBACK LASERS; FREQUENCY DOMAIN ANALYSIS; LIGHT POLARIZATION; LIGHT REFLECTION; OPTICAL RESOLVING POWER; SEMICONDUCTOR LASERS; SIGNAL RECEIVERS; SPECTRUM ANALYZERS;

OPTICAL FREQUENCY DOMAIN REFLECTOMETRY (OFDR);

REFLECTOMETERS;

EID: 0030289059     PISSN: 10411135     EISSN: None     Source Type: Journal    
DOI: 10.1109/68.541567     Document Type: Article

References (13)

1. R. W. Tkack and A. R. Chraplyvy, "Regimes of feedback effects in 1.55 μm distributed feedback lasers," J. Lightwave Technol., vol. LT-4, pp. 1655-1661, 1986.
2. J. Mork, M. Semkow, and B. Tromborg, "Measurement and theory of mode hopping in external cavity lasers," Electron. Lett., vol. 26, no. 9, pp. 609-610, 1990.
3. J. P. von der Weid, R. Passy, and N. Gisin, "Chirp and feedback control in semiconductor pigtailed DFB lasers without integrated isolator," Electron. Lett., vol. 29, no. 1, pp. 50-51, 1992.
4. W. V. Sorin and D. M. Baney, "Measurement of Rayleigh backscattering at 1.55 μm with 32 μm spatial resolution," IEEE Photon. Technol. Lett., vol. 4, pp. 374-376, 1992.
5. K. Takada, T. Kitagawa, M. Shimizu, and M. Horiguchi, "High-sensitivity low coherence reflectometer using erbium-doped superfluorescent fiber source and erbium doped power amplifier," Electron. Lett., vol. 29, pp. 365-367, 1993.
6. W. Eickhoff and R. Ulrich, "Optical frequency domain reflectometry," Appl. Physics Lett., vol. 9, pp. 693-695, 1981.
7. D. Uttam and B. Culshaw, "Precision time domain reflectometry in optical fiber systems using frequency modulated continuous wave ranging technique," J. Lightwave Technol., vol. 3, pp. 971-977, 1985.
8. R. Passy, N. Gisin, and J. P. von der Weid, "High-sensitivity coherent optical frequency domain reflectometry for characterization of fiberoptic network components," IEEE Photon. Technol. Lett., vol. 7, no. 6, pp. 667-669, 1995.
9. G. Mussi, N. Gisin, R. Passy and J. P. von der Weid, "-152.5 dB sensitivity high dynamic range optical frequency-domain reflectometry," Electron. Lett., vol. 32, no. 10, pp. 926-927, 1996.
10. W. V. Sorin and L. Heffner, "Polarization independent interferometric optical coherence-domain reflectometry," U.S. Patent 95202745, 1993.
11. M. Kobayashi, H. Hanafusa, K. Takada, and J. Noda, "Polarization-independent interferometric optical time domain reflectometer," J. Lightwave Technol, vol. 9, pp. 623-628, 1991.
12. R. Passy, N. Gisin, and J. P. von der Weid, "Experimental and theoretical investigation of coherent OFDR with semiconductor laser sources," J. Lightwave Technol., vol. 12, no. 9, pp. 1622-1630, 1994.
13. J. H. Malitson, "Interspecimen comparison of the refractive index of fused silica," J. Opt. Soc. Amer. vol. 55, pp. 1205-1209, 1965.