Quality improvement for RC06 chip resistor

Quality and Reliability Engineering International

Volumn 12, Issue 6, 1996, Pages 439-445

  Jeng, Yann Chyn ^a   Guo, Shin Ming ^a  

^a Kaohsiung Polytechnic Institute Taiwan   (Taiwan)

Author keywords

Accumulation analysis; ANOVA; Categorical data; Scoring scheme; Taguchi method

Indexed keywords

COMPUTER APPLICATIONS; DATA REDUCTION; OPTIMIZATION; PROBABILITY; QUALITY ASSURANCE; RATING; RESISTORS; SEMICONDUCTOR DEVICE MANUFACTURE; SIGNAL TO NOISE RATIO;

ACCUMULATION ANALYSIS; CATEGORICAL DATA; TAGUCHI METHOD; WEIGHTED PROBABILITY SCORING SCHEME;

QUALITY CONTROL;

EID: 0030288928     PISSN: 07488017     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1099-1638(199611)12:6<439::AID-QRE61>3.0.CO;2-0     Document Type: Article

References (4)

1. G. Taguchi, Statistical Analysis (in Japanese), Maruzen, Tokyo, 1966.
2. V. N. Nair, 'Testing in industrial experiments with ordered categorical data', Technometrics, 28, 283-291 (1986).
3. A. Agresti. The Analysis of Ordinal Categorical Data, J Wiley, New York, 1984.
4. V. N. Nair, 'Taguchi's parameter design: a panel discussion', Technometrics, 34, 2, 127-132 (1992).