Extraction of experimental mobility data for MOS devices

IEEE Transactions on Electron Devices

Volumn 43, Issue 11, 1996, Pages 1981-1988

  Hauser, John R ^a  

^a NORTH CAROLINA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; CURVE FITTING; ELECTRON TRANSPORT PROPERTIES; LEAST SQUARES APPROXIMATIONS; SEMICONDUCTOR DEVICE MODELS; VOLTAGE MEASUREMENT;

SURFACE MOBILITY; SURFACE THRESHOLD VOLTAGE;

MOS DEVICES;

EID: 0030288532     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/16.543036     Document Type: Article

References (20)

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