Electro-optic beam scanner in KTiOPO4

Applied Physics Letters

Volumn 69, Issue 21, 1996, Pages 3134-3136

  Chiu, Y ^a   Stancil, D D ^a   Schlesinger, T E ^a   Risk, W P ^b  

^a CARNEGIE MELLON UNIVERSITY   (United States)

^b IBM ALMADEN RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANGLE MEASUREMENT; BANDWIDTH; ELECTRIC FIELD EFFECTS; ELECTRODES; ION EXCHANGE; PHOSPHATES; PYROELECTRICITY; RUBIDIUM COMPOUNDS; WAVEGUIDES;

DEFLECTION SENSITIVITY; DOMAIN INVERSION; ELECTROOPTIC BEAM SCANNER; ELECTROSTATIC TONING; POTASSIUM TITANYL PHOSPHATE; PULSED ELECTRIC POLING;

ELECTROOPTICAL DEVICES;

EID: 0030288108     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.116806     Document Type: Article

References (12)

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