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Volumn 288, Issue 1-2, 1996, Pages 272-278

Molecular packing in new Langmuir-Blodgett systems investigated by X-ray specular reflectivity and grazing incidence X-ray diffraction

(9) Giannini, C a Tapfer, L a Sauvage Simkin, M b,d Garreau, Y b Jedrecy, N b Veron M B b Pinchaux, R b,e Burghard, M c Roth, S c

a Centro Nazionale per la Ricerca e lo Sviluppo dei Materiali (Italy)

b UNIVERSITÉ PARIS SACLAY (France)

c MAX PLANCK INSTITUT FÜR FESTKÖRPERFORSCHUNG (Germany)

d UNIVERSITÉ PIERRE ET MARIE CURIE (France)

e SORBONNE UNIVERSITÉ (France)

Author keywords

Langmuir Blodgett films; Multilayers; Structural properties; X ray scattering

Indexed keywords

AMMONIUM COMPOUNDS; CRYSTAL ORIENTATION; MOLECULAR STRUCTURE; MULTILAYERS; SEMICONDUCTING FILMS; X RAY CRYSTALLOGRAPHY;

AMMONIUM SALT; BRAGG PEAKS; GRAZING INCIDENCE X RAY DIFFRACTION MEASUREMENTS (GIXD); KIESSIG FRINGES; MONOPHASIC STRUCTURES; TETRACARBOXYLDIIMIDE DERIVATIVE ORIENTATION;

LANGMUIR BLODGETT FILMS;

EID: 0030288030 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/S0040-6090(96)08854-2 Document Type: Article

Times cited : (6)

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