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Volumn 272, Issue 1-2, 1996, Pages 1-12
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Texture analysis of Bi-2212 and 2223 tapes and wires by neutron diffraction
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Author keywords
[No Author keywords available]
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Indexed keywords
CRYSTAL ORIENTATION;
CRYSTAL SYMMETRY;
CRYSTALLOGRAPHY;
GRAIN SIZE AND SHAPE;
MAGNETIC TAPE;
NEUTRON DIFFRACTION;
SILVER;
TEXTURES;
WIRE;
MULTIFILAMENTARY TAPES;
ORIENTATION DISTRIBUTION;
POSITION SENSITIVE DETECTORS;
SILVER SHEATHED MONOCORE TAPES;
TEXTURE ANALYSIS;
HIGH TEMPERATURE SUPERCONDUCTORS;
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EID: 0030287979
PISSN: 09214534
EISSN: None
Source Type: Journal
DOI: 10.1016/S0921-4534(96)00561-8 Document Type: Article |
Times cited : (18)
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References (35)
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