An apparatus for infrared transmittance and reflectance measurements at cryogenic temperatures

International Journal of Thermophysics

Volumn 17, Issue 6, 1996, Pages 1441-1454

  Zhang, Z M ^a   Hanssen, L M ^b   Datla, R U ^b   Drew, H D ^c  

^a UNIVERSITY OF FLORIDA   (United States)

^b NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^c Bldg 142   (United States)

Author keywords

Cryogenics; Radiative properties; Reflectance; Transmittance

Indexed keywords

BOLOMETERS; CRYOGENICS; FOURIER TRANSFORM INFRARED SPECTROSCOPY; INFRARED RADIATION; OPTICAL PROPERTIES; REFLECTOMETERS; SOLIDS; SPECTROMETERS;

ANGLE OF INCIDENCE; BOLOMETRIC DETECTORS; CRYOGENIC OPTICAL APPARATUS; FOURIER TRANSFORM SPECTROMETER; INFRARED PROPERTIES; INFRARED TRANSMITTANCE;

CRYSTALS;

EID: 0030287787     PISSN: 0195928X     EISSN: None     Source Type: Journal    
DOI: 10.1007/BF01438678     Document Type: Article

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