![]() |
Volumn 44, Issue 3, 1996, Pages 251-260
|
Study of annealing effects of cuprous oxide grown by electrodeposition technique
a
|
Author keywords
Copper oxide; Electrodeposition; Spectral response; Thermal annealing
|
Indexed keywords
ANNEALING;
CRYSTALLOGRAPHY;
ELECTRODEPOSITION;
ENERGY GAP;
HEAT TREATMENT;
LIGHT ABSORPTION;
LOW TEMPERATURE OPERATIONS;
PHOTOCONDUCTIVITY;
SCANNING ELECTRON MICROSCOPY;
SEMICONDUCTOR GROWTH;
THERMAL EFFECTS;
X RAY DIFFRACTION;
BAND GAP;
CUPROUS OXIDE;
PHOTORESPONSE;
SPECTRAL RESPONSE;
THERMAL ANNEALING;
COPPER OXIDES;
|
EID: 0030287476
PISSN: 09270248
EISSN: None
Source Type: Journal
DOI: 10.1016/0927-0248(96)00043-8 Document Type: Article |
Times cited : (86)
|
References (8)
|