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Volumn 44, Issue 3, 1996, Pages 251-260

Study of annealing effects of cuprous oxide grown by electrodeposition technique

Author keywords

Copper oxide; Electrodeposition; Spectral response; Thermal annealing

Indexed keywords

ANNEALING; CRYSTALLOGRAPHY; ELECTRODEPOSITION; ENERGY GAP; HEAT TREATMENT; LIGHT ABSORPTION; LOW TEMPERATURE OPERATIONS; PHOTOCONDUCTIVITY; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTOR GROWTH; THERMAL EFFECTS; X RAY DIFFRACTION;

EID: 0030287476     PISSN: 09270248     EISSN: None     Source Type: Journal    
DOI: 10.1016/0927-0248(96)00043-8     Document Type: Article
Times cited : (86)

References (8)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.