The effect of thermalisation length and work function on epithermal positron emission from solids

Surface Science

Volumn 367, Issue 2, 1996, Pages 238-244

  Knights, A P ^a,b   Coleman, P G ^a  

^a UNIVERSITY OF EAST ANGLIA   (United Kingdom)

^b UNIVERSITY OF WESTERN ONTARIO   (Canada)

Author keywords

Electrical transport; Metallic surfaces; Positron solid interactions; Positron spectroscopy; Semiconducting surfaces; Surface electronic phenomena; Work function measurements

Indexed keywords

EMISSION SPECTROSCOPY; ENERGY GAP; GOLD; INTERFACES (MATERIALS); LEAD; SEMICONDUCTING SILICON; SEMICONDUCTING SILICON COMPOUNDS; SILVER; SURFACE PHENOMENA; SURFACE STRUCTURE; THERMAL DIFFUSION IN SOLIDS; TIN;

ELECTRICAL TRANSPORT; POSITRON EMISSION; POSITRON SOLID INTERACTIONS; POSITRON SPECTROSCOPY; THERMALIZATION LENGTH; WORK FUNCTION MEASUREMENTS;

POLYCRYSTALLINE MATERIALS;

EID: 0030287141     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(96)00863-1     Document Type: Article

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