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Volumn 43, Issue 11, 1996, Pages 2027-2029

Forward transit time measurement for heterojunction bipolar transistors using simple Z parameter equation

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTATIONAL METHODS; ELECTRIC NETWORK PARAMETERS; ELECTRIC RESISTANCE MEASUREMENT;

EID: 0030286665     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/16.543045     Document Type: Article
Times cited : (6)

References (8)
  • 1
    • 0026203903 scopus 로고
    • S. Lee A. Gopinath S. J. Pachuta Accurate measurement technique for the base transit time in heterojunction bipolar transistors Electron. Lett. 27 1551 1553 1991 2220 3646 132801
    • (1991) , vol.27 , pp. 1551-1553
    • Lee, S.1    Gopinath, A.2    Pachuta, S.J.3
  • 2
    • 0026836812 scopus 로고
    • P. C. Grossman J. C. Choma Large signal modeling of HBT's including self-heating and transit time effects IEEE Trans. Microwave Theory Tech. 40 449 464 1992 22 3466 121720
    • (1992) , vol.40 , pp. 449-464
    • Grossman, P.C.1    Choma, J.C.2
  • 3
    • 0028377237 scopus 로고
    • S. Lee B. R. Ryum S. W. Kang A new parameter extraction technique for small-signal equivalent circuit of polysilicon emitter bipolar transistors IEEE Trans. Electron Devices 41 233 238 1994 16 6850 277373
    • (1994) , vol.41 , pp. 233-238
    • Lee, S.1    Ryum, B.R.2    Kang, S.W.3
  • 5
    • 85176670250 scopus 로고
    • 2nd Wiley New York
    • S. M. Sze Physics of Semiconductor Devices 2nd 46 1981 Wiley New York
    • (1981) , pp. 46
    • Sze, S.M.1
  • 6
    • 85176678190 scopus 로고
    • D. R. Pehlke D. Pavlidis New analytic determination of $f_{T},$ $f_{{\\rm MAX}}$ and the frequency dependence of current gain and power gain in HBT's Proc. IEEE/Cornell Conf. Advanced Concepts in High-Speed Semicond. Devices and Circuits 75 82 1993 1045 7465 303071
    • (1993) , pp. 75-82
    • Pehlke, D.R.1    Pavlidis, D.2
  • 8
    • 85176670003 scopus 로고
    • Elsevier The Netherlands
    • I. E. Getreu Modeling the Bipolar Transistor. 140 143 1978 Elsevier The Netherlands
    • (1978) , pp. 140-143
    • Getreu, I.E.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.