Effects of simulated annealing in the resonant-tunneling resistive-fuse network for early vision

IEICE Transactions on Electronics

Volumn E79-C, Issue 11, 1996, Pages 1543-1549

  Maezawa, Koichi ^a  

^a NTT CORPORATION   (Japan)

Author keywords

Image processing; Resistive fuse; Resonant tunneling diode; Simulated annealing

Indexed keywords

COMPUTER SIMULATION; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC FUSES; ELECTRIC NETWORK ANALYSIS; ELECTRON TUNNELING; IMAGE PROCESSING; QUANTUM ELECTRONICS; SIMULATED ANNEALING;

CIRCUIT SIMULATION; RESONANT TUNNELING DIODES; RESONANT TUNNELING RESISTIVE FUSE NETWORK; SIGNAL STRENGTH;

TUNNEL DIODES;

EID: 0030286230     PISSN: 09168524     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (11)

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