Low-frequency intensity noise in semiconductor lasers

Applied Optics

Volumn 35, Issue 33, 1996, Pages 6438-6444

  Hall, M M ^a   Carlsten, J L ^a  

^a MONTANA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE CARRIERS; ELECTRIC CURRENTS; FOURIER TRANSFORMS; LASER MODES; LASER THEORY; LIGHT EMITTING DIODES; MATHEMATICAL MODELS; PHOTODIODES; PHOTONS; SHOT NOISE; SIGNAL NOISE MEASUREMENT; SPURIOUS SIGNAL NOISE;

ELECTRON HOLE RECOMBINATION RATE; FABRY-PEROT SEMICONDUCTOR LASER; INJECTION CURRENT; LANGEVIN NOISE SOURCES; PHOTON LOSS RATE; RADIATIVE RECOMBINATION COEFFICIENT; SHOT NOISE LIMIT; SIDE MODE SUPPRESSION; SINGLE MODE THEORY; SPONTANEOUS EMISSION COEFFICIENT;

SEMICONDUCTOR LASERS;

EID: 0030285607     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.35.006438     Document Type: Article

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