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Volumn 32, Issue 11, 1996, Pages
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Optical sensor inspects parts with 3-D imaging
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Author keywords
[No Author keywords available]
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Indexed keywords
IMAGING SYSTEMS;
INSPECTION;
SEMICONDUCTOR LASERS;
SPATIAL VARIABLES MEASUREMENT;
STEREO VISION;
AUTOMATED DEFECT INSPECTION;
COORDINATE MEASURING MACHINES (CMM);
TRIANGULATION;
FIBER OPTIC SENSORS;
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EID: 0030285425
PISSN: 07402511
EISSN: None
Source Type: Journal
DOI: None Document Type: Article |
Times cited : (1)
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References (0)
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