RHEED-ISS study on the Zr-O/W(100) surface at high temperature

Surface Science

Volumn 367, Issue 1, 1996, Pages 96-104

  Irokawa, Y ^b   Mitsuhashi, R ^b   Lee, S C ^b   Kimura, Y ^b   Inoue, M ^a,b   Takai, Y ^b   Shimizu, R ^b  

^a SETSUNAN UNIVERSITY   (Japan)

^b OSAKA UNIVERSITY   (Japan)

Author keywords

Diffusion and migration; Low energy ion scattering (LEIS); Low index single crystal surfaces; Metal metal interfaces; Metallic films; Oxidation; Oxygen; Reflection high energy electron diffraction (RHEED); Surface segregation; Tungsten; Zirconium

Indexed keywords

DIFFUSION IN SOLIDS; HIGH TEMPERATURE EFFECTS; INTERFACES (MATERIALS); METALLIC FILMS; OXIDATION; OXYGEN; PHASE TRANSITIONS; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; SINGLE CRYSTALS; SURFACE STRUCTURE; TUNGSTEN; ZIRCONIUM;

ION SCATTERING SPECTROSCOPY; LOW ENERGY ION SCATTERING; LOW INDEX SINGLE CRYSTALS SURFACES; SURFACE SEGREGATION;

SEMICONDUCTING FILMS;

EID: 0030284894     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(96)00845-X     Document Type: Article

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