Effects of cracks on critical current density in Ag-sheathed superconductor tape

Cryogenics

Volumn 36, Issue 11, 1996, Pages 957-962

  Fang, Y ^a   Danyluk, S ^a   Lanagan, M T ^b  

^a GEORGIA INSTITUTE OF TECHNOLOGY   (United States)

^b ARGONNE NATIONAL LABORATORY   (United States)

Author keywords

Crack effect; Critical current density; High Tc; Superconductors

Indexed keywords

BISMUTH COMPOUNDS; CRACKS; ELECTRIC CURRENTS; HIGH TEMPERATURE SUPERCONDUCTORS; MATHEMATICAL MODELS; OXIDE SUPERCONDUCTORS;

AU-SHEATHED TAPES; CRITICAL CURRENT DENSITY;

TAPES;

EID: 0030284770     PISSN: 00112275     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0011-2275(96)00069-0     Document Type: Article

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