C-axis resistivities of single- and double-layered Bi-system cuprates: A comparative study

Journal of Low Temperature Physics

Volumn 105, Issue 3-4, 1996, Pages 951-956

  Wang, N L ^a,b   Geibel, C ^a   Steglich, F ^a  

^a DARMSTADT UNIVERSITY OF TECHNOLOGY   (Germany)

^b UNIVERSITY OF SCIENCE AND TECHNOLOGY OF CHINA   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ANISOTROPY; COMPOSITION EFFECTS; DOPING (ADDITIVES); ELECTRIC CONDUCTIVITY MEASUREMENT; ELECTRIC CONDUCTIVITY OF SOLIDS; ELECTRIC EXCITATION; THERMAL EFFECTS;

ANISOTROPIC RESISTIVITIES; CHARGE EXCITATION SPECTRA; DOUBLE-LAYERED BISYSTEM CUPRATES; MOTT LIMIT; SINGLE-LAYERED BISYSTEM CUPRATES;

OXIDE SUPERCONDUCTORS;

EID: 0030284604     PISSN: 00222291     EISSN: None     Source Type: Journal    
DOI: 10.1007/BF00768505     Document Type: Review

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