Pulsed laser recording of gratings in SiO-Cu quantum dot thin films

Applied Physics Letters

Volumn 69, Issue 22, 1996, Pages 3297-3299

  Kaganovskii, Yu ^a   Rosenbluh, M ^a  

^a BAR ILAN UNIVERSITY   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

CALCULATIONS; COPPER; LIGHT INTERFERENCE; OPTICAL RECORDING; PULSED LASER APPLICATIONS; SEMICONDUCTOR QUANTUM DOTS; SILICA; TEMPERATURE DISTRIBUTION; THERMAL STRESS; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY;

METAL CLUSTERS; OPTICAL HEATING; PULSED LASER RECORDING;

DIFFRACTION GRATINGS;

EID: 0030284582     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.117285     Document Type: Article

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