Evidence for field emission in electroformed metal-insulator-metal devices

Thin Solid Films

Volumn 288, Issue 1-2, 1996, Pages 164-170

  Sharpe, R G ^a   Palmer, R E ^b  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

^b UNIVERSITY OF BIRMINGHAM   (United Kingdom)

Author keywords

Conductivity; Field emission

Indexed keywords

CHARGE CARRIERS; COPPER COMPOUNDS; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC CONDUCTIVITY OF SOLIDS; ELECTRON EMISSION; ELECTRON TUNNELING; ENERGY DISSIPATION; LOW TEMPERATURE OPERATIONS;

FOWLER NORDHEIM FIELD EMISSION;

MIM DEVICES;

EID: 0030284554     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(96)08804-9     Document Type: Article

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