Effect of processing route and parameters on the dielectric properties of the valence compensated composition Sr0.65La0.35Ti0.65Co0.35O 3

Journal of Materials Science Letters

Volumn 15, Issue 21, 1996, Pages 1865-1867

  Dwivedi, R K ^a   Parkash, Om ^a   Christopher, C C ^a   Kumar, D ^a   Pandey, L ^b  

^a BANARAS HINDU UNIVERSITY   (India)

^b RANI DURGAVATI UNIVERSITY   (India)

Author keywords

[No Author keywords available]

Indexed keywords

CERAMIC MATERIALS; COMPOSITION; DIELECTRIC PROPERTIES; DIFFERENTIAL THERMAL ANALYSIS; GRAIN BOUNDARIES; PERMITTIVITY; SCANNING ELECTRON MICROSCOPY; SINTERING; SOL-GELS; STOICHIOMETRY; TEMPERATURE; X RAY DIFFRACTION;

DIELECTRIC LOSS; ELECTRONIC CERAMICS; PROCESSING ROUTE; STOICHIOMETRIC COMPOSITION;

STRONTIUM COMPOUNDS;

EID: 0030284460     PISSN: 02618028     EISSN: None     Source Type: Journal    
DOI: 10.1007/BF00264080     Document Type: Article

References (7)

1. N. YAMAOKA, Bull. Amer. Ceram. Soc. 65 (1986) 1149.
2. OM PARKASH, CH. DURGA PRASAD and D. KUMAR, J. Mater. Sci. 25 (1990) 487.
3. I. BURN and S. NEIRMAN, J. Mater. Sci. ibid. 17 (1982) 3510.
4. SHAIL UPADHYAY, M. Tech. Thesis School of Materials Science and Technology Institute of Technology BHU Varanasi (1993) India.
5. R. WERNICKE, "Advances in ceramics", Vol. 1 (American Ceramic Society Inc., Columbus, OH, 1981) pp. 261-271.
6. OM PARKASH, CH. DURGA PRASAD and D. KUMAR, Phys. Status Solidi (a) 116 (1989) K 81.
7. M. PECHINI, US Patent 3 330697 (1967).