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Volumn 105, Issue 3-4, 1996, Pages 489-494
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Atomic-plane-selective STM imaging and STS on the Bi2Sr2CaCu2O8-δ cleaved surface
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Author keywords
[No Author keywords available]
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Indexed keywords
CRYSTAL SYMMETRY;
ELECTRON TUNNELING;
ELECTRONIC STRUCTURE;
ENERGY GAP;
IMAGING TECHNIQUES;
OXIDE SUPERCONDUCTORS;
SCANNING TUNNELING MICROSCOPY;
SPECTROSCOPIC ANALYSIS;
ATOMIC RANGE;
CLEAVED SURFACE;
SEMICONDUCTING GAP;
SUPERCONDUCTING GAP;
TUNNELING SPECTRA;
HIGH TEMPERATURE SUPERCONDUCTORS;
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EID: 0030284357
PISSN: 00222291
EISSN: None
Source Type: Journal
DOI: 10.1007/BF00768433 Document Type: Article |
Times cited : (2)
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References (20)
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