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Volumn 31, Issue 22, 1996, Pages 5907-5914

Structural studies of TiN/ZrN multilayer coating deposited by physical vapour deposition

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL LATTICES; CRYSTAL ORIENTATION; CRYSTAL STRUCTURE; LATTICE CONSTANTS; MAGNETRONS; MULTILAYERS; STOICHIOMETRY; TITANIUM NITRIDE; TRANSMISSION ELECTRON MICROSCOPY; VAPOR DEPOSITION; X RAY DIFFRACTION ANALYSIS;

EID: 0030283996     PISSN: 00222461     EISSN: None     Source Type: Journal    
DOI: 10.1007/BF01152140     Document Type: Article
Times cited : (19)

References (32)
  • 23
    • 25444471394 scopus 로고
    • International Centre for Diffraction Data, PA
    • JCPDS Index Nos 38-1420 and 35-0753 (International Centre for Diffraction Data, PA, 1993).
    • (1993) JCPDS Index Nos 38-1420 and 35-0753
  • 26
    • 0001874777 scopus 로고
    • edited by J. L. Vossen and W. Kern Academic Press, London
    • J. L. VOSSEN and J. J. CUOMO, in "Thin Film Processes", edited by J. L. Vossen and W. Kern (Academic Press, London, 1978) pp. 12-73.
    • (1978) Thin Film Processes , pp. 12-73
    • Vossen, J.L.1    Cuomo, J.J.2
  • 32
    • 25444449115 scopus 로고
    • International Centre for Diffraction Data, PA
    • JCPDS Index No. 37-1140 (International Centre for Diffraction Data, PA, 1993).
    • (1993) JCPDS Index No. 37-1140


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.