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Volumn 69, Issue 20, 1996, Pages 2977-2979

Characterization of Nd:Y3Al5O12 thin films grown on various substrates by pulsed laser deposition

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; DEPOSITION; DOPING (ADDITIVES); FILM GROWTH; GARNETS; NEODYMIUM; OPTICAL PROPERTIES; PHOTOLUMINESCENCE; PULSED LASER APPLICATIONS; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SOLID STATE LASERS; X RAY CRYSTALLOGRAPHY;

EID: 0030283905     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.117749     Document Type: Article
Times cited : (53)

References (14)
  • 12
    • 85033847990 scopus 로고    scopus 로고
    • X-ray powder diffraction data card: JCPDS No. 13-04943
    • X-ray powder diffraction data card: JCPDS No. 13-04943.
  • 13
    • 85033869896 scopus 로고    scopus 로고
    • X-ray powder diffraction data card: JCPDS No. 33-40
    • X-ray powder diffraction data card: JCPDS No. 33-40.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.