Transmission electron microscopy of metallic multilayers

Journal De Physique. IV : JP

Volumn 6, Issue 7, 1996, Pages

  Walls, M G ^a   Chevalier, J P ^a   Hytch M J ^a  

^a CNRS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONIC STRUCTURE; GRAIN SIZE AND SHAPE; IMAGING TECHNIQUES; INTERFACES (MATERIALS); MAGNETIC MATERIALS; MAGNETIC PROPERTIES; MICROSTRUCTURE; MULTILAYERS; OPTICAL PROPERTIES; TRANSMISSION ELECTRON MICROSCOPY;

DIFFRACTION CONTRAST IMAGING; FRESNEL FRINGE METHOD; METALLIC MULTILAYERS; PHASE CONTRAST IMAGING;

METALLIC FILMS;

EID: 0030281882     PISSN: 11554339     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (44)

1. Chevalier J.P., in Multilayers materials Science Forum 59-60 eds. Chamerod and Hillairet. Trans Tech Publications Zurich (1989) 141
2. Sheng T. T. and Marcus R. B. J. Electrochem. Soc. 127 (1980) 737-743.
3. Benedict J., Anderson R., Klepeis S. and Choker M., Mater. Res. Soc. Symp. Proc. 199 (1990) 189-190.
4. Folkerts W. and Hakkens F., J Appl Phys 73, (1993) 3922-3925.
5. Spence J. C.H. Experimental High Resolution Electron Microcopy, Oxford University Press (1988)
6. Reimer L. Transmission Electron Microscopy, Physics of Image Formation and Microanalysis, Springer Ser. Opt. Sci. 36 Springer. Berlin. Heiddbereg (1984)
7. Wang Y. S. and Simon J. P., J Mater Sci 27 (1992) 6755-6764.
8. Gajdardziska-Josifovska M., Weiss J. K. and Cowley J. M., Ultramicroscopy 58 (1995) 65-78.
9. Visokay M. R., Kuwabara M. and Hayashi H., J Magn Magn Mater 126 (1993) 131-140.
10. Bayle P., Deutsch T., Gilles B., Lançon F., Marty A. and Thibault J., Ultramicroscopy 56 (1994) 94-107.
11. Cho N. H., Krishnan K. M. Lucas C. A. and Farrow R. F. C., J Appl Phys 72 (1992) 5799-5807.
12. Modak A. R., Parkin S. S. P. and Smith D. J., Ultramicroscopy 47 (1992) 375-382.
13. Modak A. R., Parkin S. S. P. and Smith D. J., J Magn Magn Mater 129 (1994) 415-422.
14. Bertero G. A., Hufnagel T. C., Clemens B. M. and Sinclair R., J Mater Res 8 (1993) 771-774.
15. Dochnomae H., Jpn J Appl Phys Pt 1 33 (1994) 1499-1508.
16. Wang L., Fricoteaux P., Yuzhang K., Troyon M., Bonhomme P., Douglade J. and Metrot A., Thin Solid Films 261 (1995) 160-167.
17. Snoeck E., Sinclair R., Parker M. A., Hylton T. L., Coffey K. R., Howard J. K., Lessmann A. and Bienenstock A. I., J Magn Magn Mater 151 (1995) 24-32.
18. Jiang S. S., Zou J., Cockayne D. J. H. Sikorski A. Hu A. and Peng R. W., Phil Mag B 66 (1992) 229-237.
19. Jiang S. S., Zou J., Cockayne D. J. H., Sikorski A., Hu A. and Peng R. W., Phys Status Solidi A-Appl Res 130 (1992) 373-381.
20. Ahuja R. and Fraser H. L., J Electron Mater 23 (1994) 1027-1034.
21. Krawietz R., Wehner B., Meyer D., Richter K., Mai H., Dietsch R., Hopfe S., Scholz R. and Pompe W., Fresenius J Anal Chem 353 (1995) 246-250.
22. Fullerton E. E., Pearson J., Sowers C. H., Bader S. D., Wu X. Z. and Sinha S. K., Phys Rev B-Condensed Matter 48 (1993) 17432-17444.
23. Hakkens F. J. G. De Veirman A. E. M., Coene W. and Den Broeder F. J. A., J. Mater Res. 8 (1993) 1019-1027.
24. Modak A. R., Smith D. J. and Parkin S. S. P., Phys Rev B-Condensed Matter 50 (1994) 4232-4235.
25. Bernardi J., Hutten A., Friedrichs S., Ecber C. E. and Thomas G., Phys Status Solidi A·Appl Res 147 (1995) 165-175.
26. Carcia P. F., Li Z. G., Reilly M. and Zeper W. B., J Appl Phys 73 (1993) 6424-6426.
27. South D. J., Li Z. G., Modak A. R., Parkin S. S. P., Farrow R. F. C. and Marks R. F., Scr Metall Mater 30 (1994) 689-694.
28. Mitwalsky A., Sporl K. and Weller D., J Appl Phys 73 (1993) 4942-4950.
29. Parker M. A., Hylton T. L., Coffey K. R. and Howard J. K, J Appl Phys 75 (1994) 6382-6384.
30. Takenaka H., Kawamura T., Ishii Y. and Asagiri S., J Appl Phys 78 (1995) 5227-5230.
31. Thangaraj N. and Krithnan K. M. and Farrow R. F. C., Scripta Metall 33 (1995) 1667-1677.
32. Smith D. J., Li Z. G., Modak A. R., Parkin S. S. P., Farrow R. F. C. and Marks R. F. Scripta Metall. 30 689-694
33. Valet T., Galtier P., Jacquet J. C., Meny C. and Panissod P., J Magn Magn Mater 121 (1993) 402-405.
34. Nallet P., Chassaing E., Walls M. G. and Hytch M. J., J. Appl Phys 79 (1996) 6884-6889
35. Doole R. C., Petfordlong A. K. and Jakubovics J. P., Rev Sci Instr 64 (1993) 1038-1043.
36. Kim J. D., Petfordlong A. K., Jakubovics J. P., Evens J. E. and Somekh R., J Appl Phys 76 (1994) 2387-2394.
37. Gu E. Daboo C., Bland J. A. C., Gester M., Ives A. J. R., Brown L. M., Stelmashenko N. A. and Chapman J. N., J Magn Mater 126 (1993) 180-184.
38. Heyderman L. J., Chapman J. N. and Parkin S. S. P., J Magn Magn Mater 138 (1994) 344-354.
39. Donnet D. M., Chapman J. N., Vankesteren H. W. and Zeper W. B., J Magn Magn Mater 115 (1992) 342-352.
40. Ploessl R., Chapman J. N., Scheinfein M. R., Blue J. L., Mansuripur M. and Hoffmann H., J Appl Phys 74 (1993) 7431-7437.
41. Tencé M., Quartuccio M. and Colliex C., Ultramicroscopy 58 (1995) 42-54.
42. Siadelmann P., Leifer K. and Verdon C., Ultramicroscopy 58 (1995) 35-41.
43. Kimoto K., Hirano T., Usami K. and Hoshiya H., Jpn J Appl Phys Pt 2 33 (1994) L1642-L1644.
44. Wang Z. L. and Shapiro A. J., Ultramicroscopy 60 (1995) 115-135.