Influence of the ferroelectric domain structure and switching properties on the endurance of PZT ferroelectric capacitors

Microelectronics Reliability

Volumn 36, Issue 11-12 SPEC. ISS., 1996, Pages 1763-1766

  Wouters, D J ^a   Maes, H E ^a  

^a IMEC   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITOR STORAGE; DURABILITY; FERROELECTRIC DEVICES; HYSTERESIS; LEAD COMPOUNDS; POLARIZATION; SWITCHING; CAPACITORS; CRYSTAL ORIENTATION; FATIGUE TESTING; MAGNETIC DOMAINS; MAGNETIC HYSTERESIS;

ELECTRIC FATIGUE; FERROELECTRIC DOMAIN STRUCTURE; ELECTRICAL FATIGUE; LEAD ZIRCONATE TITANATE (PZT);

CAPACITORS; FERROELECTRIC DEVICES;

EID: 0030274009     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/0026-2714(96)00193-x     Document Type: Article

References (8)

1. W.I. Kinney and F.D. Gealy, Memory Applications of Integrated Ferroelectric Technology, Proceedings of the 1994 ISSCC, p. 266, IEEE (1994).
2. G.J. Willems, D.J. Wouters, and H.E. Maes, Influence of the Pt Electrode on the Properties of Sol-Gel PZT-Films, Microelectronic Engineering, 29, p.217 (1995).
3. G.J. Willems, D.J. Wouters, H.E. Maes, and R. Nouwen, Nucleation and Orientation of Sol-Gel PZT-Films on Pt Electrodes, presented at the 8th ISIF, March 1996, Tempe, AZ, USA; to be published in Integrated Ferroelectrics.
4. G.J. Willems, D.J. Wouters, H.E. Maes, and R. Nouwen, Nucleation and Orientation of Sol-Gel PZT-Films on Pt Electrodes, presented at the 8th ISIF, March 1996, Tempe, AZ, USA; to be published in Integrated Ferroelectrics.
5. D.J. Wouters, G. Willems, E-G. Lee, and H.E. Maes, Elucidation of the Switching Processes in Tetragonal PZT by Hysteresis Loop and Impedance Analysis, presented at the 8th ISIF, March 1996, Tempe, AZ, USA; to be published in Integrated Ferroelectrics.
6. D.J. Wouters, G. Willems, E-G. Lee, and H.E. Maes, Elucidation of the Switching Processes in Tetragonal PZT by Hysteresis Loop and Impedance Analysis, presented at the 8th ISIF, March 1996, Tempe, AZ, USA; to be published in Integrated Ferroelectrics.
7. D.J. Taylor, P.K. Larsen, G.J.M. Dormans, and A.E.M. De Veirman, Pulse Switching Characterization of OMCVD Deposited PZT Thin Films for High-Density Memory Applications, Integrated Ferroelectrics 7, p. 123 (1995).
8. R. Ramesh, W.K. Chan, B. Wilkens, T. Sands, J.M. Tarascon, and V.G. Keramidas, Fatigue and Aging in Ferroelectric PZT/YBCO Heterostructures, Integrated Ferroelectrics 1, p.1 (1992).