Stress-induced vertical confinement of light in bulk GaAs and Si substrates

IEEE Photonics Technology Letters

Volumn 8, Issue 10, 1996, Pages 1358-1360

  Almashary, Bandar A ^a,b   Kim, Hong Koo ^a,b  

^a PA 15213   (United States)

^b IEEE

Author keywords

[No Author keywords available]

Indexed keywords

INTERFACES (MATERIALS); NUMERICAL ANALYSIS; PERMITTIVITY; PHOTOELASTICITY; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTING SILICON; SEMICONDUCTOR DEVICE STRUCTURES; STRESS CONCENTRATION; SUBSTRATES; THIN FILMS;

LIGHT CONFINEMENT; PHOTOELASTIC EFFECT; SEMICONDUCTOR MESA;

OPTICAL WAVEGUIDES;

EID: 0030270798     PISSN: 10411135     EISSN: None     Source Type: Journal    
DOI: 10.1109/68.536654     Document Type: Article

References (10)

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