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Volumn 84, Issue 1-3, 1996, Pages 353-362
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Resputtering effects during ion beam assisted deposition and the sputter yield amplification effect
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Author keywords
Computer simulation; Enhanced sputtering; Ion assisted deposition; Preferential sputtering
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Indexed keywords
COMPUTER SIMULATION;
DEPOSITION;
IMPURITIES;
ION BEAMS;
MATHEMATICAL MODELS;
ULTRATHIN FILMS;
ENHANCED SPUTTERING;
ION BEAM ASSISTED DEPOSITION;
SPUTTER YIELD AMPLIFICATION;
SPUTTERING;
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EID: 0030270774
PISSN: 02578972
EISSN: None
Source Type: Journal
DOI: 10.1016/S0257-8972(95)02762-9 Document Type: Article |
Times cited : (21)
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References (14)
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