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Volumn 84, Issue 1-3, 1996, Pages 353-362

Resputtering effects during ion beam assisted deposition and the sputter yield amplification effect

Author keywords

Computer simulation; Enhanced sputtering; Ion assisted deposition; Preferential sputtering

Indexed keywords

COMPUTER SIMULATION; DEPOSITION; IMPURITIES; ION BEAMS; MATHEMATICAL MODELS; ULTRATHIN FILMS;

EID: 0030270774     PISSN: 02578972     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0257-8972(95)02762-9     Document Type: Article
Times cited : (21)

References (14)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.